Access
Staff review sample suitability, training, safety and the requested time before confirming a booking.
Overview
Field-emission scanning electron microscope with focused ion beam capability.
Capabilities
SEM, focused ion beam, energy-dispersive X-ray spectroscopy
- Contact
- MMU: +27 (0)11 717 1334
- Custodian
- Dr Jacques Gerber, +27 (0)11 717 1336
- Keywords
- FEG-SEM, FIB, EDS
- Official source
- Wits Microscopy & Microanalysis Unit — Microscopes
- Last checked
- 2026-09-17