Access
Operational verification required
Overview
Provisional research resource supporting X-Ray Diffraction, Phase Identification, Crystallographic Analysis. Operational verification is pending. Availability, access arrangements and the responsible operational contact have not yet been confirmed by the responsible unit.
Capabilities
X-Ray Diffraction Phase Identification Crystallographic Analysis
Research applications
- Keywords
- X-Ray Diffractometer, Material Characterization, Pharmaceutical Polymorphism, Thin Film Analysis
- Official source
- FHS Equipment Register