Access
Staff review sample suitability, training, safety and the requested time before confirming a booking.
Overview
Field-emission environmental scanning electron microscope for SEM imaging and analysis.
Capabilities
SEM, environmental SEM, in-situ SEM, EDS, backscattered-electron imaging
- Contact
- MMU: +27 (0)11 717 1334
- Custodian
- Dr Jacques Gerber, +27 (0)11 717 1336
- Keywords
- FEG-SEM, ESEM, EDS, BSE
- Official source
- Wits Microscopy & Microanalysis Unit — Microscopes
- Last checked
- 2026-09-17